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NTBG020N090SC1 SiC MOSFET Data

Data for the NTBG020N090SC1 900V 20mΩ silicon carbide MOSFET including electrical parameters, maximum current and voltage, pin connections, package type and many other datasheet details.




Key details and performance parameters for the NTBG020N090SC1 SiC MOSFET.


NTBG020N090SC1 Silicon Carbide MOSFET datasheet parameters & data
 
Parameters Details
Brief description 900V
Package type D2PAK-7L / TO263-7L
Operational mode Enhancement
Channel type N-channel
Drain to Source voltage VDSS 900V
Drain to gate voltage VDGR
Gate to source voltage VGSS +22 / -8V
Maximum drain current continuous ID 112A at 25°C
Maximum drain current pulsed ID 448A at 25°C
Zero gate voltage drain current IDSS 100µA at VDS=900V, VGS=0V and 25°C
250µA at VDS=900V, VGS=0V and 175°C
Gate threshold voltage VGS(th) 1.8V min, 2.6V typ, 4.3V max with VGS=VDS and ID=20mA
Static drain source ON resistance RDS(ON) 20mΩ typ, 28mΩ max at VGS=15V, ID=60A and 25°C
16mΩ typ, at VGS=18V, ID=60A and 25°C
27mΩ typ, at VGS=15V, ID=60A and 175°C
Forward transconductance gFS 49 for VDS=20V and ID=60A
Input capacitance 4415pF
Output capacitance 295pF
Reverse transfer capacitance 25pF
TJ °C 175
PTOT mW 477W
Primary manufacturer On Semiconductor

    Outlines & pinout:





Explanation of SiC MOSFET parameters


Parameter Explanation
Operational mode This details whether the FET is an enhancement or depletion mode
Channel type The channel of the MOSFET can either be an N-type channel where electrons are the majority carriers or P-type where holes are the majority current carrier.
Drain to Source voltage VDSS This is the maximum voltage that can be sustained between the drain and source
Gate to source voltage VGSS This is the maximum voltage that can be sustained between the drain and the gate.
Maximum drain current continuous ID This is the maximum current that can be carried byt he device. Sometimes there may be a differentiation between the continuous and pulsed or peak values

Parameter Explanation
Zero gate voltage drain current IDSS This is the current carried by the device when the gate voltage is zero. The test conditions are normally stated for this.
Gate threshold voltage VGS(th) This is the minimum gate-to-source voltage, VGS required to create a conductive channel between the source and drain terminals
Static drain source ON resistance RDS(ON) This is the resistance of the device when turned on. The test conditions of voltage and current are normally given for this.
Drain source ON voltage VDS(ON) This is the voltage across the device when it is turned on. Again the test conditions are given.
Forward transconductance gFS Forward transconductance also given the letters gm is defined as the change in drain current (ΔID) for a small change in the gate-source voltage ΔVGS, with the drain-source voltage, VDS held constant.

These are the main SiC MOSFET parameters that have been included in our list. Being a form of MOSFET, they are basically the same as other FETs and MOSFETs.

 

Read more about . . . . FET Specifications & Parameters.

 

Read more about . . . . Silicon carbide MOSFET technology.


Please note, that the data given is the best estimate we can give within a tabulated summary of this nature. Parameters also vary between manufacturers. Electronics Notes cannot accept any responsibility for errors, inaccuracies, etc, although we do endevaour to ensure the data is as accurate as possible.




Notes and supplementary information

 

  •   Availability & sources

The NTBG020N090SC1 is available from a number of stockists and electronic component distributors many of which are given in the table below.


NTBG020N090SC1 Component Distributor, Stock and Pricing

 


  •   Further details

The low RDS ON of 28mΩ typical at 15V and the high maximum voltage along with all the other benefits of silicon carbide MOSFETs mean that this device is ideal for use in uninterruptible power supplies, DC-DC converters, boost inverters and other forms of switch mode power supply.

Ian Poole   Written by Ian Poole .
  Experienced electronics engineer and author.




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